Optics: measuring and testing – Of light reflection
Reexamination Certificate
2008-04-01
2008-04-01
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
Of light reflection
C436S518000, C315S082000, C315S165000
Reexamination Certificate
active
07352467
ABSTRACT:
A surface plasmon resonance imaging system (40) and method is provided. The system (40) includes a light source (42) comprising a light-emitting diode (LED) array that is positioned at the focal point of a collimating lens (44). The light source (42) and collimating lens (44) are used to illuminate the substrate surface (50) at a range of angles dependent upon which one or more LEDs are lit. The substrate surface (50) receives light from the collimated lens (44) at a selected incident angle, which can be varied by selective illumination of one or more of the LEDs in the LED array. The system (40) further includes a detector (60) that is positioned such that it is capable of detecting an image reflected from the substrate surface (50).
REFERENCES:
patent: 6493097 (2002-12-01), Ivarsson
patent: 2002/0028519 (2002-03-01), Yguerabide et al.
patent: 2004/0038264 (2004-02-01), Souza et al.
Alli Iyabo S
Christensen O'Connor Johnson & Kindness PLLC
Lauchman Layla G.
University of Washington
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