Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-05-03
2005-05-03
Zarneke, David (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S760020
Reexamination Certificate
active
06888360
ABSTRACT:
This invention provides an evaluation board for evaluating one or more aspects of a surface mount technology system. In one aspect, the evaluation board has a substrate with at least one surface. A plurality of board pad patterns, each including a plurality of board pads, is formed on the surface. The different board pad patterns may have different shaped, sized and spaced board pads, allowing the characteristics of a surface mount technology to be tested on some or all of the board pad patterns at the same time and under uniform conditions. In another aspect, the surface may have a plurality of area-filled board pads similarly allowing a surface mount technology to be tested on the various area-filled board pads.
REFERENCES:
patent: 4467638 (1984-08-01), Greenstein
patent: 4529116 (1985-07-01), Gutbier
patent: 5457880 (1995-10-01), McKinley et al.
patent: 5827951 (1998-10-01), Yost et al.
patent: 5862973 (1999-01-01), Wasserman
patent: 5926696 (1999-07-01), Baxter et al.
patent: 6013877 (2000-01-01), Degani et al.
patent: 6020749 (2000-02-01), Morris et al.
patent: 6040530 (2000-03-01), Wharton et al.
patent: 6286208 (2001-09-01), Shih et al.
patent: 6300781 (2001-10-01), Yap et al.
patent: 6476629 (2002-11-01), Bjork
patent: 6564986 (2003-05-01), Hsieh
patent: 6600233 (2003-07-01), Yeoh et al.
patent: 6700800 (2004-03-01), Combs et al.
patent: 20030041753 (2003-03-01), Regner et al.
patent: 20030057264 (2003-03-01), Yoshikawa et al.
patent: 199 10 407 (2000-09-01), None
patent: 0 779 774 (1997-06-01), None
patent: 0 926 930 (1999-06-01), None
patent: 03244188 (1991-10-01), None
patent: 05200991 (1993-08-01), None
patent: 10256722 (1998-09-01), None
patent: WO 9842167 (1998-09-01), None
Heraeus Benchmarker II Pad Geometries and Dimensions.
www.bomir.com/online/indexphp?sub =249.
Lathrop, Richard R. et al., The SMT Process Benchmarking Toolkit, Heraeus.
Lathrop, Richard, “Defining Solder Paste Performace via Novel Quantitative Methods”, APEX 2003.
Heraeus SMT Test Boards OSP and AU.
Christian Beverly Howard
Connell David James
Bereskin & Parr
Hollington Jermele
Research In Motion Limited
Zarneke David
LandOfFree
Surface mount technology evaluation board having varied... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface mount technology evaluation board having varied..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface mount technology evaluation board having varied... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3438118