Measuring and testing – Vibration – By mechanical waves
Patent
1993-05-10
1995-07-11
Williams, Hezron E.
Measuring and testing
Vibration
By mechanical waves
73634, 73643, 250307, 250423F, G01N 2924
Patent
active
054310555
ABSTRACT:
A scanning tunneling microscope, in which the gap between a tip having a keenly sharpened end and a sample is narrowed to let flow a tunneling current between them and thereby allow observation of the surface of the sample, a strain wave detecting device is disposed on the sample or in the vicinity of the sample to detect strain waves generated within the sample. By modulating the value of the above described tunneling current, strain waves are generated within the sample. The strain waves are detected by the above described strain wave detecting device. On the basis of the amplitude information and phase information of detected strain waves, physical information regarding the inside of the sample is obtained.
REFERENCES:
patent: 3577774 (1971-05-01), Steffens et al.
patent: 4618767 (1986-10-01), Smith et al.
patent: 4668865 (1987-05-01), Gimzewski et al.
patent: 4902892 (1990-02-01), Okayama et al.
patent: 4987303 (1991-01-01), Takase et al.
patent: 5003815 (1991-04-01), Martin et al.
patent: 5107112 (1992-04-01), Yanagisawa et al.
"Acoustic Detector and Generator" (IBM Technical Bulletin) (Apr. 1987) (vol. 29 No. 11).
"Effect of electronic strain on photoacoustic generation in Silicon", by R. G. Stearns and G. S. Kino, Appl. Phys. Lett. 47(10), Nov. 15, 1985, pp. 1048-1050.
"Visualization of surface elastic waves on structural materials" by G. Alers, M. A. Temison, R. B. Thompson, and B. R. Tittman (Jul. 1973) Ultrasonics.
"Photostriction Effect in Germanium" by T. Figielski, Phys. Status Solidi, vol. 1, 306 (1961) pp. 306-316.
"Generation of Elastic Waves by Transient Surface Heating" by R. M. White (Journal of Applied Physics, vol. 34, No. 12, Dec. 1963).
"Elastic Wave Generation by Electron Bombardment or Electromagnetic Wave Absorption" by R. M. White (Communications, Oct. 29, 1962).
Hosaka Sumio
Hosoki Shigeyuki
Shimizu Hiromichi
Takata Keiji
Finley Rose M.
Hitachi , Ltd.
Williams Hezron E.
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