Surface inspection systems

Optics: measuring and testing – Of light reflection – With diffusion

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250571, 356431, G01N 2130

Patent

active

041393074

ABSTRACT:
A surface inspection system has a light beam repetitively scanning a surface and a receiver located to receive light specularly (directly) reflected. The receiver has an enclosure with a wall containing a plurality of slits by which reflected light can reach a detector in the enclosure. The slits are arranged to cause the detector to produce a series of pulses throughout the scan, each pulse providing an instantaneous picture of the surface gloss in terms of an intensity distribution, the half width of each pulse is measured to give an indication of any variation from the half width of the distribution for a known surface gloss.

REFERENCES:
patent: 3922093 (1975-11-01), Dandliker et al.
patent: 3984189 (1976-10-01), Seki et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Surface inspection systems does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface inspection systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface inspection systems will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-688913

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.