Optics: measuring and testing – Of light reflection – With diffusion
Patent
1979-03-29
1983-09-06
Corbin, John K.
Optics: measuring and testing
Of light reflection
With diffusion
356445, 356430, 356426, 356244, G01N 2147, G01N 2155, G01N 2184, G01N 2101
Patent
active
044026137
ABSTRACT:
A surface inspection system utilizes a laser light source, and a vacuum chuck to support the material whose surface is to be inspected. The vacuum chuck is rotatable. The laser beam may be translated across the work surface while the chuck is rotated, all the while maintaining mutual perpendicularity of the vacuum chuck work surface and the laser beam. An airtrack transports the material whose surface is to be inspected. Sensors are utilized to detect the position of such material along the track and to guide the system in its operation.
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Daly John K.
Terry Malvin D.
Advanced Semiconductor Materials America
Bovernick Rodney B.
Corbin John K.
Weiss Harry M.
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