Surface inspection apparatus and method thereof

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S237200

Reexamination Certificate

active

07417244

ABSTRACT:
An apparatus for detecting defects, including: a first illumination optical unit which illuminates from a normal direction or in the vicinity of the normal direction; a second illumination optical unit which illuminates from a first elevation angle; a first detection optical unit which detects light reflected by the illumination of the first illumination optical unit or the second illumination optical unit with plural detectors; a second detection optical unit which detects light reflected by the illumination of the first illumination optical unit or the second illumination optical unit with plural detectors; wherein the plural detectors of the first detection optical unit and the plural detectors of the second detection optical unit are photomultipliers, and the signal processor processes the signals outputted from the photomultipliers and are adjusted to balance in sensitivities.

REFERENCES:
patent: 4449818 (1984-05-01), Yamaguchi et al.
patent: 4889998 (1989-12-01), Hayano et al.
patent: 5486919 (1996-01-01), Tsuji et al.
patent: 5712701 (1998-01-01), Clementi et al.
patent: 5903342 (1999-05-01), Yatsugake et al.
patent: 6104481 (2000-08-01), Sekine et al.
patent: 6366352 (2002-04-01), Goldberg et al.
patent: 6894302 (2005-05-01), Ishimaru et al.
patent: 2002/0036771 (2002-03-01), Sato et al.
patent: 2002/0041374 (2002-04-01), Ohshima et al.
patent: 57-013340 (1982-01-01), None
patent: 57-132044 (1982-08-01), None
patent: 03-102248 (1991-04-01), None
patent: 03-102249 (1991-04-01), None
patent: 09-304289 (1997-11-01), None
patent: 11-064234 (1999-03-01), None
patent: 11-142127 (1999-05-01), None
patent: 11-160245 (1999-06-01), None
patent: 97/35161 (1997-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Surface inspection apparatus and method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface inspection apparatus and method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface inspection apparatus and method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3996515

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.