Surface inspection apparatus and method

Details Surface inspection apparatus and method Surface inspection apparatus and method

1991-10-28

1993-07-06

Willis, Davis L.

Optics: measuring and testing

By polarized light examination

With light attenuation

356237, 356445, G01B 1130, G01N 2100

Patent

active

052258904

ABSTRACT:
An apparatus for inspecting a reflective surface of an article for defects includes a point light source for generally uniformly illuminating the entire surface of the article under inspection, and a diffusing screen for intercepting the light rays reflected from the surface under inspection of the article. The intercepted light rays produce a high resolution image on the screen consisting of bright and dark areas or spots corresponding to surface defects in the article under inspection.

REFERENCES:
patent: 2798966 (1957-07-01), Summerhayes, Jr.
patent: 3019346 (1962-01-01), Laycak
patent: 3439988 (1969-04-01), Breske
patent: 3590258 (1971-06-01), Shibata et al.
patent: 3666370 (1972-05-01), Seasholtz
patent: 3734626 (1973-05-01), Roberts et al.
patent: 3794427 (1974-02-01), Shibata et al.
patent: 3797943 (1974-03-01), Nagao et al.
patent: 3814945 (1974-06-01), Allnutt et al.
patent: 3857637 (1974-12-01), Obenreder
patent: 3866038 (1975-02-01), Korth
patent: 3871771 (1975-03-01), Scott
patent: 3892494 (1975-07-01), Baker et al.
patent: 3922093 (1975-11-01), Dandliker et al.
patent: 3976382 (1976-08-01), Westby
patent: 4130361 (1978-12-01), Humphrey
patent: 4172666 (1979-10-01), Clarke
patent: 4207467 (1980-06-01), Doyle
patent: 4547073 (1985-10-01), Kugimiya
patent: 4621063 (1986-11-01), Wyatt et al.
patent: 4629319 (1986-12-01), Clarke et al.

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