Surface inspecting apparatus with surface inspection width adjus

Details Surface inspecting apparatus with surface inspection width adjus Surface inspecting apparatus with surface inspection width adjus

1990-10-17

1992-11-24

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250560, 250236, 356431, G01N 2188, H01J 314

Patent

active

051665352

ABSTRACT:
A surface inspecting apparatus generates an inspecting width gate signal by in a procedure wherein when the subject matter is subjected to the scanning via the light beam, a counting means digitizes the detected position of both the front and rear ends of the subject and then an operating means calculates values which indicate the positions included within the range between both of the ends, thus generating the inspecting width gate signal. Consequently, it is possible to inspect any subject matter without manually resetting the effective inspecting range whenever a subject matter changes in width.

REFERENCES:
patent: 3646353 (1972-02-01), Bhullar et al.
patent: 4173441 (1979-11-01), Wolf
patent: 4205769 (1980-06-01), Blitchington
patent: 4211132 (1980-07-01), Nichols, III et al.
patent: 4247204 (1981-01-01), Merlen et al.
patent: 4538915 (1985-09-01), Faulhaber
patent: 4791304 (1988-12-01), Iida
patent: 4868403 (1989-01-01), Takahashi et al.

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