Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2005-09-20
2008-11-11
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
C356S300000
Reexamination Certificate
active
07450227
ABSTRACT:
An improved substrate for Raman spectroscopy of an analyte comprises a porous metal film. Enhancement factors and uniformity of the substrate can be enhanced by electrochemical roughening of the film. Improved sensors and spectrometers using such substrates are also described.
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Allara David L.
Dwight David W.
Gifford Krass Sprinkle Anderson & Citkowski P.C.
The Penn State Research Foundation
Toatley , Jr. Gregory J.
Underwood Jarreas C
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