Optics: measuring and testing – Shape or surface configuration – By projection of coded pattern
Reexamination Certificate
2011-01-11
2011-01-11
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
By projection of coded pattern
C356S603000
Reexamination Certificate
active
07869061
ABSTRACT:
A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means2capable of switching and displaying a plurality of kinds of light-and-shade patterns5, capturing means3for capturing mirror images, reflected in the specular or semi-specular surface of a measurement target1, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating means10for performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface.
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Iwama Takashi
Saito Takanobu
Sato Kentaro
Uesugi Mitsuaki
Yoshitake Akihide
JFE Steel Corporation
JFE Techno-Research Corporation
Oliff & Berridg,e PLC
Toatley Gregory J
Ton Tri T
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