Surface defect probe and dual channel apparatus with liftoff com

Details Surface defect probe and dual channel apparatus with liftoff com Surface defect probe and dual channel apparatus with liftoff com

1975-06-25

1976-08-10

Corcoran, Robert J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

G01R 3312

Patent

active

039744426

ABSTRACT:
Apparatus for detecting surface defects in steel billets comprises an h.f. energized eddy current probe for scanning over the surface of the billet and a dual channel receiver responsive to signals from this probe dependent on (a) any surface defects, and (b) the probe surface spacing, in a manner such that in one channel a predominant factor in the signal waveform is characteristic of (a) while in the other channel a predominant factor in the signal is characteristic of (b). The signals from the two channels are combined in a summing amplifier and a difference amplifier whereby the outputs therefrom are conditioned to be exclusively characteristic of (a) and (b) respectively.

REFERENCES:
patent: 2744233 (1956-05-01), Paivenen
patent: 2985824 (1961-05-01), Renken, Jr.
patent: 3358225 (1967-12-01), Peugeot
patent: 3611120 (1971-10-01), Forster
Allen, J. W., Eddy Current Testing in Practice, Oak Ridge Nat. Lab. Publication No. 2655, Apr. 30, 1959, pp. 18-26.

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