Surface defect inspection system and method

Radiant energy – Invisible radiant energy responsive electric signalling – Ultraviolet light responsive means

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

2503581, 356237, G01N 2147, G01N 2188

Patent

active

054931231

ABSTRACT:
System and method are disclosed for inspecting objects, such as sheets of flat panel glass, to detect flaws or contamination at a surface. The surface to be inspected is illuminated with 253.7 nm ultraviolet (UV) radiation to assure detection of defects only at the front surface subjected to the radiation. UV radiation reaching the front surface is scattered by defects at the front surface, and scattered UV radiation is collected by a UV dark field imaging system and directed by the imaging system to a detecting unit, preferably including a charge coupled device (CCD). The detecting unit senses UV radiation scattered at the surface due to defects within a selected size range and provides an output to a processing unit providing an output indicative of the defects sensed within the selected size range. The illumination system preferably illuminates the entire surface to be inspected, an enclosed dark field chamber having shielding houses the illuminating source and radiation collecting system, an anti-reflecting UV coating is preferably used, as is a bandpass filter, and the detecting unit is preferably cooled, accompanied by heating of the imaging system. The system is capable of detecting defects at least as small as five microns using a ten second sampling period.

REFERENCES:
patent: 4314763 (1982-02-01), Steigmeier et al.
patent: 4598997 (1986-07-01), Steigmeier et al.
patent: 4659933 (1987-04-01), Anthon
patent: 4798465 (1989-01-01), Knollenberg
patent: 4893928 (1990-01-01), Knollenberg
patent: 4893932 (1990-01-01), Knollenberg
patent: 5264912 (1993-11-01), Vaught et al.
patent: 5282151 (1994-01-01), Knollenberg
"The Importance of Media Refractivr Index in Evaluating Liquid and Surface Microcontamination Measurements" By Dr. Robert G. Knollenberg In Proceedings--Institute of Environmental Sciences (No Date).
"A Polarization Diversity Two-Color Surface Analysis System" By Robert G. Knollenberg In Proceeding--Institute of Environmental Sciences (No Date).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Surface defect inspection system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface defect inspection system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface defect inspection system and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1357523

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.