Boots – shoes – and leggings
Patent
1980-11-28
1983-09-06
Chin, Gary
Boots, shoes, and leggings
358106, 356237, 250562, G01N 2148
Patent
active
044032943
ABSTRACT:
A surface defect inspection system comprises an image pick-up device for picking up an image by sequentially scanning the surface of an object two-dimensionally, a threshold circuit for quantizing the image signal produced from the image pick-up device as a binary code, a pattern feature extracting device for making calculations for extracting the features of image patterns from the quantized signal in synchronism with the scanning, and for temporarily storing the result of the calculations, a pattern region end decision device for deciding that individual pattern regions have ended in one direction, and a defect decision device for reading out from the pattern feature extracting device the result of the calculations on the pattern features corresponding to the positions each of the patterns in the direction perpendicular to the one direction each time of the decision that each pattern region has ended, so that the feature of each pattern scanned is compared with a predetermined reference, thus deciding and an indication of producing the presence or absence of a defect.
REFERENCES:
patent: 3887762 (1975-06-01), Uno et al.
patent: 3988530 (1976-10-01), Ikegami et al.
patent: 4110048 (1978-08-01), Akutsu et al.
patent: 4110736 (1978-08-01), Kono
patent: 4148065 (1979-04-01), Nakagawa et al.
patent: 4162126 (1979-07-01), Nakagawa et al.
patent: 4173441 (1979-11-01), Wolf
patent: 4183013 (1980-01-01), Agrawala et al.
patent: 4223346 (1980-09-01), Neiheisel et al.
patent: 4237539 (1980-12-01), Piovoso et al.
Hamada Toshimitsu
Makihira Hiroshi
Nakagawa Yasuo
Udaka Makoto
Chin Gary
Hitachi , Ltd.
Japan Nuclear Fuel Co., Ltd.
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