Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1976-08-17
1978-06-20
Corbin, John K.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
250572, 350296, 356210, 356237, G01N 2132
Patent
active
040959058
ABSTRACT:
A surface-defect detecting device including: illuminating means for illuminating a minute peripheral or annular zone on the surface of a material to be inspected, such as the circumferential surface of a cylindrical body; at least a pair of reflecting mirrors having ellipsoidal or spheroidal surfaces and first focal points positioned at the minute annular zone so as to focus the light reflecting from the aforesaid minute annular zone on the circumferential surface of the body; and photoelectric elements positioned at second the other focal points of the reflecting mirrors, respectively; whereby when a defect is not present in the minute annular zone on the circumferential surface of the body, the light is regularly reflected on the surface of the body to be inspected, so as not to be received by the photoelectric elements, and on the other hand, when a defect is present on the minute annular zone on the circumferential surface of the body, the light is irregularly reflected on the minute annular zone to be received by photoelectric elements, so that the body may be inspected for a defect on its surface according to signals obtained from the photoelectric elements, and the defect thus detected may be determined for its size.
REFERENCES:
patent: 2220488 (1940-11-01), Lott
patent: 3266313 (1966-08-01), Litterst
Akiyama Nobuyuki
Kuni Asahiro
Corbin John K.
Hitachi , Ltd.
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