Surface curvature measuring apparatus for object profiles

Details Surface curvature measuring apparatus for object profiles Surface curvature measuring apparatus for object profiles

2007-11-20

2007-11-20

Bennett, G. Bradley (Department: 2859)

Geometrical instruments

Gauge

Pitchometer

C033S553000

Reexamination Certificate

active

11308139

ABSTRACT:
A surface curvature measuring apparatus includes a platform and a magnetically attractable curvature-measuring module. The platform has a rotary mechanism to mount and to rotate a sample object. The magnetically attractable curvature-measuring module includes a fixed guiding member, a movable measuring member and a magnetically attractable slide track. The movable measuring member includes a magnetic slide to attract the magnetically attractable slide track, and a measuring rod to be in contact with an undersurface of the sample object. The magnetic slide attracts the magnetically attractable slide track but the movable measuring member disposed between the fixed guiding member and the magnetically attractable slide track is capable of moving upwardly or downwardly. When the sample object rotates, a downward stress exerted by the sample object presses on the measuring rod such that the movable measuring member is moved downwardly to appear positions of the undersurface, and subsequently stopped.

REFERENCES:
patent: 2717453 (1955-09-01), Wildt
patent: 2737726 (1956-03-01), Christiansen
patent: 3380170 (1968-04-01), Read
patent: 3631603 (1972-01-01), Munro et al.
patent: 4603487 (1986-08-01), Matsunata
patent: 6895682 (2005-05-01), Sohn et al.
patent: 2006/0156566 (2006-07-01), Ingram et al.
Taiwanese Patent Publication No. 543522, Jul. 21, 2003, 7 pages.
Taiwanese Patent Publication No. 312336, Aug. 1, 1997, 5 pages.

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