Surface coordinate system

Details Surface coordinate system Surface coordinate system

2008-01-01

2008-01-01

Punnoose, Roy M. (Department: 2886)

Optics: measuring and testing

Angle measuring or angular axial alignment

Sides of angle or axes being aligned transverse to optical...

Reexamination Certificate

active

07315360

ABSTRACT:
A method for creating a reference for a first position on a substrate edge. A first reference point is selected relative to a circumference of the substrate edge, and a second reference point is selected relative to a bevel of the substrate edge. A first distance along the circumference of the substrate edge between the first reference point and the first position is identified as a first coordinate, and a second distance along the bevel of the substrate edge between the second reference point and the first position is identified as a second coordinate. The first coordinate and the second coordinate are used as the reference for the first position.

REFERENCES:
patent: 5438209 (1995-08-01), Yamamoto et al.
patent: 6342705 (2002-01-01), Li et al.
patent: 6432800 (2002-08-01), Park
patent: 6906794 (2005-06-01), Tsuji

Affiliated with

Also associated with

Rating

Surface coordinate system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface coordinate system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface coordinate system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2806566