Surface conditioning insulating layer for fine line conductive p

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

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257506, 438638, H01L 2900, H01L 2348

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active

057675821

ABSTRACT:
The surface of an insulating layer is conditioned by treatment with ammonium hydroxide and hydrogen peroxide, thereby reducing the frequency of shorting between conductive lines of a subsequently formed conductive pattern thereon.

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H. Kaigawa et al., "Etching of Thermally Grown SiO.sub.2 by NH.sub.4 OH in Mixture of NH.sub.4 OH and H.sub.2 O.sub.2 Cleaning Solution," Japanese Journal of Applied Physics, vol. 33, No. 7A, Jul. 1994, 4080-4085.
N. Watanabe et al., "Etching Rates of SiO.sub.2 and Si.sub.3 N.sub.4 Insulating Films in Ammonia Hydrogen-Peroxide Cleaning Process," Extended Abstracts, vol. 83, No. 1, May 1983, Pennington, New Jersey, pp. 221-222.

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