Image analysis – Applications – Surface texture or roughness measuring
Patent
1997-12-29
2000-02-22
Au, Amelia
Image analysis
Applications
Surface texture or roughness measuring
382149, 382259, 382263, 382283, 404107, G06K 900, G06K 942, G06K 920, E01C 2302
Patent
active
060289481
ABSTRACT:
A method (30) is provided for the detection and analysis of anomalies (32) in a road surface (36). An image (34) of the road surface (36) is obtained (82) wherein traffic control markings (76) are masked (88). The image (34) is filtered (90) and a pixel map (92) is produced (98). The pixel map (92) is partitioned (112) into a multiplicity of subimages (108). For each subimage (108), anomaly parameters are identified (120) and a status characteristic is determined (124) and assigned (136). A subimage map (138) is produced (142) depicting the subimages (108) and their status characteristics. A determination (156) is made as to which subimages (108) contain anomalies (32). Anomaly-containing subimages (108) are grouped (158) into anomalous objects (152). For each anomalous object (152), an object type (162) is determined (160) and assigned (164). An object map (154) is then produced (166) depicting the anomalous objects (152).
REFERENCES:
patent: 4958306 (1990-09-01), Powell et al.
patent: 5163319 (1992-11-01), Spies et al.
patent: 5301129 (1994-04-01), McKaughan et al.
patent: 5466934 (1995-11-01), Adams et al.
patent: 5544256 (1996-08-01), Brecher et al.
patent: 5684898 (1997-11-01), Brady et al.
patent: 5803661 (1998-09-01), Lemelson
patent: 5923430 (1999-07-01), Worster et al.
Road surface inspection using laser scanners adapted for the high precision 3D measurements of large flat surfaces, Talbot et al; IEEE Proceedings on 3 D Digital Imaging and Modeling, ISBN: 0-8186-794-3, pp. 303-310, May 1997.
Philippe Delagnes and Dominique Barba, "A Markov Random Field for Rectilinear Structure Extraction in Pavement Distress Image Analysis", Proc. IEEE Int'l Conference on Image Processing, 1995 pp. 446-449.
Roadware Website Sep. 23, 1997.
Kil David H.
Rose David W.
Shin Frances B.
Au Amelia
Dastouri Mehrdad
Gresham Lowell W.
Lockheed Martin Corporation
Meschkow Jordan M.
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