Surface analysis test defect detector for direct access storage

Details Surface analysis test defect detector for direct access storage Surface analysis test defect detector for direct access storage

1998-10-13

2000-08-15

Strecker, Gerard

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

360 25, 369 58, G01R 3312, G01N 2782, G11B 2736

Patent

active

061041882

ABSTRACT:
A method and apparatus are provided for detecting surface defects in a direct access storage device. Disk data readback sample values are converted to gain error values based upon an identified difference from predefined ideal data values. An error signal accumulator accumulates a summed value of error signals for a current sample and a predetermined number of past samples. Each sequential accumulator summed value is compared with a predetermined threshold value. An error output is generated responsive to each sequential accumulator summed value greater than or equal to the predetermined threshold value, the error output identifying the disk surface defect.

REFERENCES:
patent: 3755731 (1973-08-01), Young
patent: 5247254 (1993-09-01), Huber et al.
patent: 5424638 (1995-06-01), Huber
patent: 5592080 (1997-01-01), Matsuno

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