Image analysis – Applications – Surface texture or roughness measuring
Patent
1995-12-22
1998-09-15
Mancuso, Joseph
Image analysis
Applications
Surface texture or roughness measuring
382152, 348125, G06K 900
Patent
active
058091629
ABSTRACT:
A surface analysis system can contactlessly, automatically, and rapidly detect, classify, and evaluate a surface of an object, particularly, an optical fiber end face, for discontinuities to derive a single pass/fail conclusion regarding the surface. The surface analysis system has a scope for capturing an image of the end face. A computer is connected to the scope. A machine vision system is associated with the computer for receiving the image. A surface analysis program is associated with the computer for driving the machine vision system. The program searches for any discontinuities in the image by analyzing each pixel and a corresponding pixel structure of pixels to determine whether a discontinuity resides at each pixel. Discontinuities are classified as one of the following: binary thresholds, local gradients, and directional gradients. The pixel structure includes a plurality of pixels that were previously analyzed. The program determines whether the surface is continuous based upon any discovered discontinuities.
REFERENCES:
patent: 4738507 (1988-04-01), Palmquist
patent: 4738508 (1988-04-01), Palmquist
patent: 4787698 (1988-11-01), Lyons et al.
patent: 5179419 (1993-01-01), Palmquist et al.
patent: 5265787 (1993-11-01), Ishizaka et al.
patent: 5682440 (1997-10-01), Yukawa
"CHECKMATE F5 SYSTEM Instruction Manual," Oyokoden Lab Co., Ltd. (at least as early as 1991).
"Norland Fiber Interferometer," Norland Products Inc., New Brunswick, NJ (1992).
"ZX-1 ZOOM INTERFEROMETERS," Direct Optical Research Company, Phoenix, AZ (at least as early as Jan. 1995).
"TOPO-3D Quick Tour Manual," Wyko Corporation, Tucson, AZ., Ltd. (Feb. 1990).
Norland, Eric A., "Defining and Measuring Physical Parameters of PC Polished Connectors," The 10th Annual National Fiber Optic Engineers Conference, San Diego, CA, Jun. 12-16, 1994, pp. 259-265.
Harding, Kevin et al., "Light Engineering for Machine Vision: Techniques and Applications," Part 1 and Part 2, Mar. 2-3, 1994, Ann Arbor, Michigan, Manufacturing Engineering Certification Institute sponsored by SME.
Csipkes Andrei
Mufti Muid Ur-Rehman
Palmquist John Mark
Bobys Marc
Lucent Technologies - Inc.
Mancuso Joseph
LandOfFree
Surface analysis system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface analysis system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface analysis system and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-97354