Surface acoustic wave strain detector and gage

Details Surface acoustic wave strain detector and gage Surface acoustic wave strain detector and gage

1974-06-17

1978-06-27

Ruehl, Charles A.

Measuring and testing

Ductility or brittleness

73597, 73DIG4, 310313, G01B 716, G01N 2900

Patent

active

040967409

ABSTRACT:
A strain detector comprises an oscillator having a surface acoustic wave delay line as its frequency control element. The delay line is constructed on a substrate, such as quartz which is disposed to distort in response to the strain to be measured. Distortion of the substrate alters the frequency control characteristics of the surface acoustic wave delay line with a consequent change in oscillator frequency. The change in frequency is proportional to the distortion of the substrate. A strain gage employs the detector output frequency as the input signal to a frequency measuring system.

REFERENCES:
patent: 1912213 (1933-05-01), Nicolson
patent: 3082621 (1963-03-01), Soderholm
patent: 3233466 (1966-02-01), Shaw, Jr.
patent: 3238789 (1966-03-01), Erdley
patent: 3274828 (1966-09-01), Pulvari
patent: 3340726 (1967-09-01), Armstrong et al.
patent: 3411348 (1968-11-01), Schultheis, Jr.
patent: 3572109 (1971-03-01), Yerman
patent: 3575050 (1971-04-01), Lynnworth
patent: 3766496 (1973-10-01), Whitehouse
patent: 3848144 (1974-11-01), Schissler
patent: 3878477 (1975-04-01), Dias et al.

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