Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1998-04-15
2000-03-28
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
73 2406, 324 7619, 324 7623, 324 7624, G01N 3000, G01R 23167
Patent
active
060443324
ABSTRACT:
A method for sensing and analyzing data with surface acoustic wave (SAW) devices comprises the steps of: propagating a sampling signal at a fundamental frequency through a SAW device coated for selective adsorption; measuring at least one parameter of at least one higher order harmonic of the fundamental frequency sampling signal; exposing the coated SAW device to enable the selective adsorption; measuring the at least one parameter of the at least one higher order harmonic of the fundamental frequency sampling signal after the exposing step; comparing the measurements of the at least one parameter of the at least one higher order harmonic before and after the exposing step; and, deriving a result of the selective adsorption based upon the comparing step. The at least one parameter is harmonic power and harmonic frequency. The at least one higher order harmonic is one or more odd harmonics.
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Dress William B.
Korsah Kofi
Ma Cheng Yu
Moore Michael R.
Bui Bryan
Hoff Marc S.
Lockheed Martin Energy Research Corporation
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