Suppression of the effect of harmless surface defects in eddy cu

Details Suppression of the effect of harmless surface defects in eddy cu Suppression of the effect of harmless surface defects in eddy cu

1989-02-15

1990-10-23

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Magnetic

With compensation for test variable

324232, 324238, G01N 2772, G01R 3312

Patent

active

049655191

ABSTRACT:
An eddy current testing device for inspecting test objects, for example billets, with respect to surface defects, for example surface cracks, comprises at least one transducer/sensor, for example a surface transducer or surface transducer arrangement, which is made to scan the surface of the test object. The device is characterized in that the effect of harmless surface blemishes on the testing device is suppressed, at least partially, by compensating for the sensitivity characteristic, in the scan direction of the transducer/sensor, with respect to the surface defect.

REFERENCES:
patent: 4355281 (1982-10-01), Toth et al.
patent: 4851774 (1989-07-01), Tornblom
Patent Abstracts of Japan; vol. 8, No. 219, D-306; 1656; Oct. 5, 1984; JP-A-59 10454(Kobe Seikosho K.K. 16-06-1984).
Patent Abstracts of Japan, vol. 7, No. 90 (P-191)(1235) 14th Apr. 1983; JP-A-58-17353 (Kobe Seikosho K.K.) 01-02-1983.

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