Suppression of dark current in a photosensor for imaging

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S595000, C257S446000, C257S093000, C257S374000

Reexamination Certificate

active

11052203

ABSTRACT:
A pixel cell having a halogen-rich region localized between an oxide isolation region and a photosensor. The halogen-rich region prevents leakage from the isolation region into the photosensor, thereby suppressing dark current in imagers.

REFERENCES:
patent: 5485019 (1996-01-01), Yamazaki et al.
patent: 5618379 (1997-04-01), Armacost et al.
patent: 5985689 (1999-11-01), Gofuku et al.
patent: 6271554 (2001-08-01), Nozaki et al.
patent: 6362040 (2002-03-01), Tews et al.
patent: 6566722 (2003-05-01), Lin et al.
patent: 6780666 (2004-08-01), McClure
patent: 2003/0143812 (2003-07-01), Lin
patent: 2004/0250392 (2004-12-01), Chou et al.
patent: 2005/0001248 (2005-01-01), Rhodes
patent: 2005/0112833 (2005-05-01), Hareland et al.
patent: 2005/0145902 (2005-07-01), Mouli
patent: 2006/0008938 (2006-01-01), Mouli et al.
patent: 2006/0138470 (2006-06-01), Han
patent: 2006/0246714 (2006-11-01), Derraa
Chapter 1, “Ionizing radiation effects on MOS devices and lcs”, pp. 35-62, unknown date.
B.C. Burkey et al., “The Pinned Photodiode for an Interline-Transfer CCD Image Sensor”, CH2099-0/84/0000-0028, 1984.
Masahiro Ushiyama et al., “Suppression of Anomalous Leakage Current in Tunnel Oxides by Fluorine Implantation to Realize Highly Reliable Flash Memory,” 1999 Symposium on VLSI Technology Digest of Technical Papers.
Kiyonori Ohyu et al., “Improvement of SiO2/Si Interface Properties Utilising Fluorine Ion Implantation and Drive-in Diffusion,” Japanese Journal of Applied Physics, vol. 28, No. 6, Jun. 1989, pp. 1041-1045.
Singapore Patent Office Communication issued Feb. 19, 2007.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Suppression of dark current in a photosensor for imaging does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Suppression of dark current in a photosensor for imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Suppression of dark current in a photosensor for imaging will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3893922

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.