Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Non-single crystal – or recrystallized – material forms active...
Reexamination Certificate
2006-11-15
2011-12-20
Toledo, Fernando L (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Non-single crystal, or recrystallized, material forms active...
C257S050000, C257S078000, C257S094000, C257SE27120, C257SE33005
Reexamination Certificate
active
08080824
ABSTRACT:
A semiconductor material structure includes at least one region capable of generating electrons and holes each having an associated mean kinetic energy during operation. A material layer in proximity to the region provides an associated potential energy larger than the mean kinetic energy associated with the generated electrons and the mean kinetic energy associated with the holes.
REFERENCES:
patent: 4758868 (1988-07-01), Frijlink
patent: 6157047 (2000-12-01), Fujita et al.
patent: 6838743 (2005-01-01), Yamada et al.
patent: 6933436 (2005-08-01), Shaheen et al.
patent: 6936143 (2005-08-01), Graetzel et al.
patent: 6972431 (2005-12-01), Forrest et al.
patent: 2007/0012349 (2007-01-01), Gaudiana et al.
patent: 2007/0046192 (2007-03-01), Akai et al.
Baldo, M. A. & S.R. Forrest, “Interface-Limited Injection in Amorphous Organic Semiconductors.”The American Physical Society, Physical Review B, vol. 64, Aug. 15, 2001 (pp. 085201-1 to 085201-17).
Deng, Z.B. et al., “Enhanced Brightness and Efficiency in Organic Electroluminenscent Devices using SiO2Buffer Layers.”Applied Physics Letters, vol. 74, No. 15, Apr. 12, 1999 (pp. 2227-2229).
Peumans, P. et al., “Small Molecular Weight Organic Thin-Film Photodetectors and Solar Cells.”J. of Applied Physics, vol. 93, No. 7, Apr. 1, 2003 (pp. 3693-3723).
Kim, Y. et al., “Enhanced Quantum Efficiency in Polymer Electroluminescence Devices by Inserting a Tunneling Barrier Formed by Langmuir-Blodgett Films,”Applied Physics Letters, vol. 69, No. 5, Jul. 29, 1996 (pp. 599-601).
Kondakov, D. Y., “Voltammetric Study of Bphen Electron-Transport Layer in Contact with LiF/Al Cathode in Organic Light-Emitting Diodes.”J. of Applied Physics, vol. 99, 2006 (pp. 024901-1 to 024901-3).
Lee, J. et al., “High Efficiency Organic Light-Emitting Devices with Al/NaF Cathode.”Applied Physics Letters, vol. 82, No. 2, Jan. 13, 2003 (pp. 173-175).
O'Brien, D.F. et al., “Improved Energy Transfer in Electrophosphorescent Devices.”Applied Physics Letters, vol. 74, No. 3, Apr. 12, 1999 (pp. 442-444).
Wang, X. J. et al., “Enhancement of Electron Injection in Organic Light-Emitting Devices Using an Ag/LiF Cathode.”J. of Applied Physics, vol. 95, No. 7, Apr. 1, 2004 (pp. 3828-3830).
Zhan, Y. Q. et al., “Sodium Stearate, an Effective Amphiphilic Molecule Buffer Material Between Organic and Metal Layers in Organic Light-Emitting Devices.”Applied Physics Letters, vol. 83, No. 8, Aug. 25, 2003 (pp. 1656-1658).
Zhang, S.T. et al, “Buffer-Layer-Induced Barrier Reduction: Role of Tunneling in Organic Light-Emitting Devices.”Applied Physics Letters, vol. 84, No. 3, Jan. 19, 2004 (pp. 425-427).
Ackermann, J. et al., “Highly Efficient Hybrid Solar Cells Based on an Octithiophene-GaAs Heterojuntion.”Advanced Functional Materials, vol. 15, No. 5, May 2005 (pp. 810-817).
Xue, J. et al., “A Hybrid Planar-Mixed Molecular Heterojunction Photovoltaic Cell.”Advanced Materials, vol. 17, No. 1, Jan. 6, 2005 (pp. 66-71).
Chen Kuei-Hsien
Chen Li-Chyong
Hsu Chia-Wen
Lin Chien-Hung
Academia Sinica
Fish & Richardson P.C.
Toledo Fernando L
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