Optical: systems and elements – Diffraction – Using fourier transform spatial filtering
Reexamination Certificate
2005-11-22
2005-11-22
Boutsikaris, Leonidas (Department: 2872)
Optical: systems and elements
Diffraction
Using fourier transform spatial filtering
C359S566000, C359S569000, C219S121610
Reexamination Certificate
active
06967777
ABSTRACT:
A DOE homogenizer including a plurality of parallel lasers emitting Gaussian beams of a diameter d along beam lines extending in a z-direction and aligning at a pitch p in an x-direction, and off-axis DOEs diffracting the Gaussian laser beams at inclining diffraction angles, making quasi-uniform density q×w (q>w) stripe-sectioned beams on an image plane I (xy-plane) which is distanced by a focal length f from the DOEs and aligning at the pitch p on an x-direction extending base line K vertical to the beam lines in an order of larger inclining diffraction angles outward and smaller inclining diffraction angles inward on extensions of the beam lines of the lasers, the DOEs diffracting the laser Gaussian beams into the quasi-uniform density stripe-sectioned beams, superposing the diffracted beams partially at edges and making a unified x-direction extending quasi-uniform beam on the image plane I.
REFERENCES:
patent: 2002/0080491 (2002-06-01), Goto
patent: 2003-270585 (2003-09-01), None
Boutsikaris Leonidas
Sumitomo Electric Industries Ltd.
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