Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board
Reexamination Certificate
2003-05-23
2008-09-30
Wong, Edna (Department: 1795)
Coating processes
Electrical product produced
Integrated circuit, printed circuit, or circuit board
C427S096100, C427S097200, C427S301000, C427S304000, C427S305000
Reexamination Certificate
active
07429401
ABSTRACT:
The process of this invention involves first adsorbing a catalyst on the surface of a specimen by immersion in a catalyst-containing solution, followed by electrolytic deposition in a second solution that need not contain catalyst. This two-step superconformal process produces a seam-free and void-free metal microelectronic conductor.
REFERENCES:
patent: 3011920 (1961-12-01), Shipley, Jr.
patent: 6077780 (2000-06-01), Dubin
patent: 6333120 (2001-12-01), DeHaven et al.
patent: 6344129 (2002-02-01), Rodbell et al.
patent: 6410418 (2002-06-01), Yang
patent: 6410442 (2002-06-01), Yang
patent: 6429523 (2002-08-01), Andricacos et al.
patent: 6534116 (2003-03-01), Basol
patent: 6680273 (2004-01-01), Goosey et al.
patent: 6755954 (2004-06-01), Mayer et al.
patent: 6827833 (2004-12-01), Taylor et al.
patent: 7045461 (2006-05-01), Imori et al.
patent: 2002/0043467 (2002-04-01), Morrissey et al.
patent: 2002/0066673 (2002-06-01), Rodbell et al.
patent: 2002/0074231 (2002-06-01), Mikkola et al.
patent: 2002/0084193 (2002-07-01), Merricks et al.
patent: 2002/0088713 (2002-07-01), Merricks et al.
patent: 2002/0090484 (2002-07-01), Merricks et al.
patent: 2002/0092673 (2002-07-01), Andricacos et al.
patent: 2002/0171151 (2002-11-01), Andricacos et al.
patent: 2004/0182714 (2004-09-01), Imori et al.
Hebert, “Analysis of Current-Potential Hysteresis During Electrodeposition of Copper with Additives”, Journal of the Electrochemical Society (no month, 2001), vol. 148, No. 11, pp. C726-C732. Abstract only.
Moffat et al., “Superconformal Electrodeposition Using Derivitized Substrates”, Electrochemical and Solid-State Letters, vol. 5, No. 12, C110-C112 (no month, 2002).
“Numerical Simulation of Superconformal Electrodeposition Using the Level Set method”; Wheeler et al (NIST); Modeling and Simulation of Microsystems 2002; 422-425, no month.
Metallurgy Divisional Publications -NISTIR 6907; Technical Highlights; “Magnetization Dynamics in Films with Nanometer Scale Microstructure”; Materials Science and Engineering Laboratory; 1-24, no date.
“Copper Electroplating for Damascene Processing”; Huong Que Tran, Department of Chemical Engineering, Georgia Institute of Technology, Atlanta, GA; 1-7, no date.
“Physics and Semiconductors”; “New Spectroscopy Tool Probes Semiconductor Etching Processes”; NIST Update; Sep. 4, 2001.
“Superconformal Silver Deposition Using KseCN Derivatized Substrates”; B.C. Baker et al; Electrochemical and Solid-State Letters, 6(5) C67-C69 (2003), no month.
“Superconformal Electrodeposition of Copper”; T. P. Moffat et al; Electrochemical and Solid-State Letters, 4(4) C26-C29 (2001), no month.
“Superconformal Electrodeposition Using Derivitized Substrates”; T. P. Moffat et al; Electrochemical and Solid-State Letters, 5(12) C110-C112 (2002), no month.
“Via Filling by Electrodeposition”; “Superconformal Silver and Copper and Conformal Nickel”; D. Josell et al; Journal of The Electrochemical Society, 149 (12) C637-C641 (2002), no month.
“Superconformal Electrodeposition of Silver in Submicrometer Features”; T. P. Moffat et al; Journal of The Electrochemical Society, 149 (8) C423-C428 (2002), no month.
“Superconformal Electrodeposition in Vias”; D. Josell et al; Electrochemical and Solid-State Letters, 5 (4) C49-C52 (2002), no month.
“Superconformal Deposition by Surfactant-Cataylized Chemical Vapor Deposition”; D. Josell et al; Electrochemical and Solid-State Letters, 5 (3) C44-C47 (2002), no month.
“A Simple Equation for Predicting Superconformal Electrodeposition in Submicrometer Trenches”; D. Josell et al; Journal of The Electrochemical Society, 148 (12) C767-C773 (2001), no month.
“Superconformal Electrodeposition in Submicron Features”; D. Josell et al; Physical Review Letters; Jul. 2, 2001, vol. 1.
Josell Daniel
Moffat Thomas P.
Wheeler Daniel
Novak Druce & Quigg LLP
The United States of America as represented by the Secretary of
Wong Edna
LandOfFree
Superconformal metal deposition using derivatized substrates does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Superconformal metal deposition using derivatized substrates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Superconformal metal deposition using derivatized substrates will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3977824