Superconductor fabrication processes

Coating processes – Measuring – testing – or indicating

Reexamination Certificate

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C427S523000, C427S529000, C427S533000, C427S595000, C505S434000, C505S480000

Reexamination Certificate

active

07338683

ABSTRACT:
A method of forming a superconductive device is provided, including providing a substrate having a dimension ratio of not less than about 102, depositing a buffer film to overlie the substrate by ion beam assisted deposition utilizing and ion beam, monitoring spatial ion beam density of the ion beam over a target area, and depositing a superconductor layer to overlie the buffer film. Monitoring may be carried out by utilizing an ion detector having an acceptance angle of not less than 10°.

REFERENCES:
patent: 4687987 (1987-08-01), Kuchnir et al.
patent: 4878014 (1989-10-01), Simpson
patent: 5196399 (1993-03-01), Shiota et al.
patent: 5198676 (1993-03-01), Benveniste et al.
patent: 5554926 (1996-09-01), Elmer et al.
patent: 5650378 (1997-07-01), Iijima et al.
patent: 5744812 (1998-04-01), Oh et al.
patent: 5903002 (1999-05-01), Turner et al.
patent: 5958157 (1999-09-01), Crow et al.
patent: 6190752 (2001-02-01), Do et al.
patent: 6214772 (2001-04-01), Iijima et al.
patent: 6300642 (2001-10-01), Cho et al.
patent: 6300755 (2001-10-01), Elmer et al.
patent: 6452165 (2002-09-01), Schwieters
patent: 6528805 (2003-03-01), Fang et al.
patent: 6632539 (2003-10-01), Iijima et al.
patent: 6797313 (2004-09-01), Fritzemeier et al.
patent: 6849580 (2005-02-01), Norton et al.
patent: 6858854 (2005-02-01), Keum et al.
patent: 6899928 (2005-05-01), Groves et al.
patent: 7026628 (2006-04-01), Krueger
patent: 7109499 (2006-09-01), Angel et al.
patent: 2003/0197132 (2003-10-01), Keum et al.
patent: 2004/0026118 (2004-02-01), Muroga et al.
patent: 2004/0262533 (2004-12-01), Krueger
patent: 2005/0094072 (2005-05-01), Lu et al.
patent: 2005/0239659 (2005-10-01), Xiong et al.
patent: 2006/0097195 (2006-05-01), Angel et al.
patent: 2006/0169922 (2006-08-01), Chang et al.
patent: 2007/0184596 (2007-08-01), Ando
Arendt et al, “YBCO/YSZ Caoted Conductors on Flexible Ni Alloy Substrates”, Applied Superconductivity, vol. 4, No. 10-11, Oct./Nov. 1996, p. 429-434.
Groves et al, “Recent progress in continuosly processed IBAD MgO Template meters for HTS applications”, Physica C,382, 2002 (no month)p. 43-47.
Groves et al, “Development of the IBAD MgO Process for HTS Coated Conductors”, Extended Abstracts of the 2001 International Workshop on Superconductivity, Honolulu, HI; Jun. 2001; 4 pages.
Gnanarajan et al, “YBCO/YSZ/Hastelloy superconducting Tapes by IBAD Magnetron Deposition”, Ceramic Transactions, vol. 140; (proceedings of the) Processing High Temperature Superconductors; Goyal et al ed., Apr. 28-May 1, 2002; p. 211-218.
Foltyn et al, “High-Tc Coated Conductors—Performance of Meter-long YBCO/IBAD Flexible Tapes”, IEEE Transactions on Applied Superconductivity, vol. 9, No. 2, Jun. 1999, p. 1519-1522.
Iijima et al, “Biaxially Aligned YSZ Buffer Layer on Polycrystalline Substrates”, Proceedings of the 4th International Simposium on Superconductivity (ISS'91), Oct. 14-17, 1991; Tokyo, Japan; 4 pages.
Wu et al, “Properties of YBa2Cu3O(7-) Thick Films on Flexible Buffered Metallic Substrates”, Appl. Phys. Lett. vol. 67, No. 16, Oct. 16, 1995; p. 2397-2399.
Iijima et al, “In-Plane Textureing Control of Y-Ba-Cu-O Thin Films on Polycrystalline Substrates by Ion-beam—Modified Intermediate Buffer Layers”, IEEE Transactions on Applied Superconductivity, vol. 3, No. 1, Mar. 1993; p. 1510-1515.

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