Coating processes – Measuring – testing – or indicating
Reexamination Certificate
2008-03-04
2008-03-04
Padgett, Marianne (Department: 1762)
Coating processes
Measuring, testing, or indicating
C427S523000, C427S529000, C427S533000, C427S595000, C505S434000, C505S480000
Reexamination Certificate
active
07338683
ABSTRACT:
A method of forming a superconductive device is provided, including providing a substrate having a dimension ratio of not less than about 102, depositing a buffer film to overlie the substrate by ion beam assisted deposition utilizing and ion beam, monitoring spatial ion beam density of the ion beam over a target area, and depositing a superconductor layer to overlie the buffer film. Monitoring may be carried out by utilizing an ion detector having an acceptance angle of not less than 10°.
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Selvamanickam Venkat
Xiong Xuming
Larson Newman Abel Polansky & White LLP
Padgett Marianne
Superpower, Inc.
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