Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent
1990-08-20
1992-02-25
Cuchlinski, Jr., William A.
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
374121, 2503362, 505847, 505849, G01N 2520, H01L 3900, G01K 716
Patent
active
050908197
ABSTRACT:
A superconducting transition edge bolometer is constructed using high critical temperature conducting films by stabilizing a substrate of magnesium oxide or sapphire with a silicon base that is bonded to the substrate using a thermally conductive bonding layer. The base is etched away in the region of the desired radiation detecting portion of the superconductor establishing a controlled thermal connection between the detecting portion and the base which base serves as a thermal bath for the bolometer.
REFERENCES:
patent: 4454522 (1984-06-01), de Lozanne
patent: 4464065 (1984-08-01), Wolf et al.
patent: 4940693 (1990-07-01), Shappirio et al.
patent: 4978853 (1990-12-01), Hilal
Golovashkin, A. I. et al., "Epitaxial Growth of YBa.sub.2 Cu.sub.3 O.sub.7-x Films on MgO Substrates," Sov. Tech. Phys. Lett. 15(2) (Feb. 1989).
Aida, T. et al., "Preparation of YBa.sub.2 Cu.sub.3 O.sub.7-x Superconducting Thin Films by R-F Magnetron Sputtering," Japanese Journal of Applied Physics, vol. 26, No. 9 (Sep. 1987).
Clarke, J. et al., "Superconductive Bolometers for Submillimeter Wavelengths," J. Appl. Phys. 48(12) (Dec. 1977).
Downey, P. M. et al., "Monolithic silicon bolometers," Applied Optics, vol. 23, No. 6 (15 Mar. 1984).
Sauvageau, J. E. et al., "Superconducting Kinetic Inductance Bolometer," Applied Superconductivity Conference (Sep. 1988).
Conductus, Inc.
Cuchlinski Jr. William A.
Gutierrez Diego F. F.
Jacobs Marvin E.
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