Organic compounds -- part of the class 532-570 series – Organic compounds – Diazo or diazonium
Reexamination Certificate
2006-09-19
2006-09-19
Powers, Fiona T. (Department: 1626)
Organic compounds -- part of the class 532-570 series
Organic compounds
Diazo or diazonium
C534S564000, C430S170000, C430S270100, C430S326000
Reexamination Certificate
active
07109311
ABSTRACT:
A chemical amplification type resist composition comprising a specific benzenesulfonyldiazomethane containing a long-chain alkoxyl group at the 2-position on benzene ring has many advantages including improved resolution, improved focus latitude, minimized line width variation or shape degradation even on long-term PED, minimized debris left after coating, development and peeling, and improved pattern profile after development and is thus suited for microfabrication.
REFERENCES:
patent: 2354229 (1944-07-01), Walter et al.
patent: 5338641 (1994-08-01), Pawlowski et al.
patent: 5558971 (1996-09-01), Urano et al.
patent: 5558976 (1996-09-01), Urano et al.
patent: 5908730 (1999-06-01), Nitta et al.
patent: 5945517 (1999-08-01), Nitta et al.
patent: 6004724 (1999-12-01), Yamato et al.
patent: 6136502 (2000-10-01), Satoshi et al.
patent: 6261738 (2001-07-01), Asakura et al.
patent: 6689530 (2004-02-01), Ohsawa et al.
patent: 6713612 (2004-03-01), Kobayashi et al.
patent: 2004/0166432 (2004-08-01), Ohsawa et al.
patent: 3-103854 (1991-04-01), None
patent: 4-211258 (1992-08-01), None
patent: 6-266112 (1994-09-01), None
patent: 8-123032 (1996-05-01), None
patent: 9-95479 (1997-04-01), None
patent: 9-208554 (1997-08-01), None
patent: 9-230588 (1997-09-01), None
patent: 9-301948 (1997-11-01), None
patent: 10-90884 (1998-04-01), None
patent: 11-38604 (1999-02-01), None
patent: 11-72921 (1999-03-01), None
patent: 2906999 (1999-04-01), None
patent: 11-190904 (1999-07-01), None
patent: 2000-314956 (2000-11-01), None
patent: 2000-344836 (2000-12-01), None
patent: 2001-55373 (2001-02-01), None
patent: 2001-106669 (2001-04-01), None
Leo A. Paquette, J. Am. Chem. Soc., vol. 86, pp. 4383-4385, (Oct. 20, 1964).
Walter et al., J. Am. Chem. Soc., vol. 67,pp. 655-657, (Apr. 1945).
Wagner et al., Synthetic Organic Chemistry, John Wiley & Sons, Inc., 1965, pp. 778-781.
Arimitsu et al., J. Photopolym. Sci. and Tech., Effect of Phenolic Hydroxyl Residues on the Improvement of Acid-Proliferation-Type Photoimaging Materials., pp. 29 & 30 (1996).
Arimitsu et al., J. Photopolym. Sci. and Tech., Sensitivity Enhancement of Chemical-Amplification-Type Photoimaging Materials By Acetoacetic Acid Derivatives, vol. 8, No. 1, pp. 43 & 44, No. 1 (1995).
Kudo et al., J. Photopolym. Sci. and Tech., Enhancement of the Senesitivity of Chemical-Amplification-type Photoimaging Materials by β-Tosyloxyketone Acetals, vol. 8, No. 1 pp. 45-46, (1995).
Kobayashi Katsuhiro
Maeda Kazunori
Ohsawa Youichi
Yanagi Yoshitaka
Birch & Stewart Kolasch & Birch, LLP
Powers Fiona T.
Shin-Etsu Chemical Co. , Ltd.
LandOfFree
Sulfonyldiazomethanes, photoacid generators, resist... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Sulfonyldiazomethanes, photoacid generators, resist..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sulfonyldiazomethanes, photoacid generators, resist... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3613310