Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2011-01-04
2011-01-04
Nguyen, Tu T (Department: 2886)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
Reexamination Certificate
active
07864312
ABSTRACT:
In one aspect, the present invention provides methods for fabricating substrates for use in a variety of analytical and/or diagnostic applications. Such a substrate can be generated by exposing a semiconductor surface (e.g., silicon surface) to a plurality of short laser pulses to generate micron-sized, and preferably submicron-sized, structures on the surface. The structured surface can then be coated with discontinuous metal coating characterized by one or more metalized surface region and a plurality of surface gaps.
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Diebold Eric
Mazur Eric
Engellenner Thomas J.
Mollaaghababa Reza
Nguyen Tu T
Nutter & McClennen & Fish LLP
President and Fellows of Harvard College
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