Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-05-31
2011-05-31
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07952379
ABSTRACT:
Exemplary embodiments relate to a substrate testing device having a comparator adapted to compare a power supply voltage supplied by a power supply voltage line with a dropped power supply voltage detected by a power supply voltage detection line and to output a voltage difference, and a level shifter circuit adapted to compensate a data voltage with a voltage up to an amount equal to the voltage difference output from the comparator and to supply the data voltage to a display panel.
REFERENCES:
patent: 4363977 (1982-12-01), Tsuda et al.
patent: 5017914 (1991-05-01), Uchida et al.
patent: 5523875 (1996-06-01), Morris
patent: 5752171 (1998-05-01), Akiya
patent: 6681100 (2004-01-01), Ge
patent: 6843597 (2005-01-01), Li et al.
patent: 6937233 (2005-08-01), Sakuma et al.
patent: 7091793 (2006-08-01), Bardsley et al.
patent: 7129939 (2006-10-01), Toyozawa et al.
patent: 7342566 (2008-03-01), Ha et al.
patent: 7583261 (2009-09-01), Shirasaki et al.
patent: 7586254 (2009-09-01), Kwak et al.
patent: 7859492 (2010-12-01), Kohno
patent: 2001/0048322 (2001-12-01), Koizumi
patent: 2004/0207593 (2004-10-01), Ha et al.
patent: 2006/0007249 (2006-01-01), Reddy et al.
patent: 2006/0244476 (2006-11-01), Zhang et al.
patent: 2007/0046590 (2007-03-01), Umezaki et al.
patent: 2007/0152935 (2007-07-01), Maede et al.
patent: 2007/0211011 (2007-09-01), Lee
patent: 2008/0238936 (2008-10-01), Kim
patent: 2009/0096770 (2009-04-01), Kawabe
patent: 2010/0007369 (2010-01-01), Kwak
patent: 1 349 139 (2003-10-01), None
patent: 2002-297098 (2002-10-01), None
patent: 2003-015613 (2003-07-01), None
patent: 2003-280590 (2003-10-01), None
patent: 2005-338769 (2005-12-01), None
patent: 2006-085169 (2006-03-01), None
patent: 2006-349966 (2006-12-01), None
patent: 2008-122848 (2008-05-01), None
patent: 10-2006-0135862 (2006-12-01), None
patent: WO 2004/114273 (2004-12-01), None
patent: WO 2005/022500 (2005-03-01), None
patent: WO 2005/122120 (2005-12-01), None
Hollington Jermele M
Lee & Morse P.C.
Samsung Mobile Display Co., Ltd.
LandOfFree
Substrate testing device and method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Substrate testing device and method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate testing device and method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2651153