Substrate temperature measurement apparatus and processing...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor

Reexamination Certificate

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Details

C374S163000, C374S208000, C374S183000, C136S200000, C136S232000

Reexamination Certificate

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07604401

ABSTRACT:
A substrate temperature measurement apparatus and a processing apparatus, whereby thermocouple wire reliability is improved, influence of infrared rays on the chip is reduced and the temperature of the substrate can be accurately measured. A chip (16) made of metal material reflecting infrared rays and electromagnetic waves, has an insertion opening (16a) for inserting thermocouple wires (20a, 20b) is crushed and deformed with the thermocouple wires inserted, and thereby united together with the thermocouple wires, and contacted with the substrate (13); and a supporting member or members (15b,15c), made of material of lower thermal conductivity than said chip (16), are provided for supporting said chip (16).

REFERENCES:
patent: 3016412 (1962-01-01), Ross
patent: 3143439 (1964-08-01), Hansen
patent: 3376170 (1968-04-01), Logan et al.
patent: 4018624 (1977-04-01), Rizzolo
patent: 4265117 (1981-05-01), Thoma et al.
patent: 4934831 (1990-06-01), Volbrecht
patent: 5176451 (1993-01-01), Sasada et al.
patent: 5527111 (1996-06-01), Lysen et al.
patent: 6025554 (2000-02-01), Macris
patent: 6040518 (2000-03-01), Kinnard
patent: 6204502 (2001-03-01), Guilmain et al.
patent: 6464393 (2002-10-01), Tatoh
patent: 6634788 (2003-10-01), Ruppert et al.
patent: 6830374 (2004-12-01), Gray
patent: 7090394 (2006-08-01), Hashikura et al.
patent: 2003/0217767 (2003-11-01), Kushihashi et al.
patent: 58-28536 (1983-06-01), None
patent: 60071924 (1985-04-01), None
patent: 61-028027 (1986-02-01), None
patent: 64-035228 (1989-02-01), None
patent: 6-112303 (1994-04-01), None
patent: 7-221154 (1995-08-01), None

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