Substrate temperature control apparatus for CVD reactors

Coating apparatus – Gas or vapor deposition – With treating means

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

118724, 118728, C23C 1600

Patent

active

055273920

ABSTRACT:
One of the critical experimental parameters affecting the quality and gro rate of chemical vapor deposition species, such as, diamond is the substrate temperature. An apparatus and technique for the precise control of the substrate temperature in a chemical vapor deposition environment has been developed. In a preferred embodiment, the technique uses a variable gas mixture in conjunction with the disclosed apparatus of the present invention to precisely control the temperature of the substrate to within at least .+-.20.degree. C. for extended periods of time and over large area substrates on the order of 1" in diameter or larger.

REFERENCES:
patent: 4047496 (1977-09-01), McNeilly
patent: 4654509 (1987-03-01), Robinson
patent: 4938940 (1990-07-01), Hirose et al.
patent: 4996942 (1991-03-01), deBoer
patent: 5033407 (1991-07-01), Mizuno
patent: 5044943 (1991-09-01), Bowman
patent: 5068871 (1991-11-01), Uchida et al.
patent: 5108792 (1992-04-01), Anderson
patent: 5182093 (1993-01-01), Cann
patent: 5188058 (1993-02-01), Nakai
patent: 5314540 (1994-05-01), Nakamura

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Substrate temperature control apparatus for CVD reactors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Substrate temperature control apparatus for CVD reactors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate temperature control apparatus for CVD reactors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-220166

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.