Etching a substrate: processes – Nongaseous phase etching of substrate
Reexamination Certificate
2007-12-18
2007-12-18
Ahmed, Shamim (Department: 1765)
Etching a substrate: processes
Nongaseous phase etching of substrate
C216S088000, C216S089000, C216S095000, C216S096000, C216S105000, C252S079100, C252S079300, C451S041000
Reexamination Certificate
active
10755314
ABSTRACT:
A substrate processing enables etching of a barrier metal film at around room temperature without application of a mechanical load and without excessive etching of a necessary portion of copper. The substrate processing flattens a copper film and a barrier metal film, both exposed on a surface of a substrate, by using an etching liquid capable of adjusting the etching rate ratio between the copper film and the barrier metal film.
REFERENCES:
patent: 3992235 (1976-11-01), Garbarini
patent: 5620558 (1997-04-01), Hanson et al.
patent: 5770095 (1998-06-01), Sasaki et al.
patent: 5981454 (1999-11-01), Small
patent: 6040243 (2000-03-01), Li et al.
patent: 6238592 (2001-05-01), Hardy et al.
patent: 6326299 (2001-12-01), Homma et al.
patent: 6426020 (2002-07-01), Okada et al.
patent: 6475909 (2002-11-01), Uozumi
patent: 6663469 (2003-12-01), Kimura et al.
patent: 2002/0017064 (2002-02-01), Shimazu et al.
patent: 2003/0073310 (2003-04-01), Olgado et al.
patent: 01/06555 (2001-01-01), None
Katakabe Ichiro
Ono Haruko
Takeda Sachiko
Ahmed Shamim
Ebara Corporation
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