Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With measuring – sensing – detection or process control means
Reexamination Certificate
2007-06-12
2007-06-12
Moore, Karla (Department: 1763)
Adhesive bonding and miscellaneous chemical manufacture
Differential fluid etching apparatus
With measuring, sensing, detection or process control means
C156S074000, C156S914000, C134S094100
Reexamination Certificate
active
10431364
ABSTRACT:
A substrate processing apparatus removes resist films formed on wafers by holding the wafers in a processing vessel and exposing the wafers to a mixed gaseous fluid of steam and an ozone-containing gas into the processing vessel. The inner surfaces, to be exposed to the mixed gaseous fluid, of the processing vessel and the surfaces, to be exposed to the mixed gaseous fluid, of component members placed in the processing vessel are coated with SiO2film to protect the same from the corrosive action of the mixed gaseous fluid.
REFERENCES:
patent: 4341592 (1982-07-01), Shortes et al.
patent: 5044311 (1991-09-01), Mase et al.
patent: 5044314 (1991-09-01), McNeilly
patent: 5073232 (1991-12-01), Ohmi et al.
patent: 5891350 (1999-04-01), Shan et al.
patent: 5944917 (1999-08-01), Takeda et al.
patent: 6090211 (2000-07-01), Kamei et al.
patent: 6299696 (2001-10-01), Kamikawa et al.
patent: 6673196 (2004-01-01), Oyabu
patent: 6786976 (2004-09-01), Gottschalk et al.
patent: 6817369 (2004-11-01), Riedel et al.
patent: 2002/0045008 (2002-04-01), Toshima et al.
patent: 2002/0134409 (2002-09-01), Scovell
patent: 62-024630 (1987-02-01), None
patent: 07037866 (1995-02-01), None
patent: 07-122537 (1995-05-01), None
patent: 9-266173 (1997-10-01), None
patent: WO 9962649 (1999-12-01), None
patent: WO 200129883 (2001-04-01), None
Taiwan Office Action issued on Mar. 3, 2005, and English translation.
Abe Hitoshi
Toshima Takayuki
Moore Karla
Smith , Gambrell & Russell, LLP
Sony Corporation
Tokyo Electron Limited
LandOfFree
Substrate processing apparatus and substrate processing method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Substrate processing apparatus and substrate processing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate processing apparatus and substrate processing method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3823844