Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus – With means for measuring – testing – or sensing
Reexamination Certificate
2007-05-01
2007-05-01
Kunemund, Robert (Department: 1722)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Apparatus
With means for measuring, testing, or sensing
C117S202000, C118S715000, C118S718000, C118S720000, C156S354000
Reexamination Certificate
active
10422408
ABSTRACT:
A substrate processing apparatus include a spin chuck capable of holding a semiconductor wafer in a horizontal position, a drive motor for driving the spin chuck for rotation, and a processing vessel accommodating the spin chuck and the drive motor50therein and capable of sealing a supercritical fluid, such as supercritical carbon dioxide, therein. The supercritical fluid flows along the upper and the lower surface of the semiconductor wafer at velocities relative to the upper and the lower surface of the semiconductor wafer as the spin chuck holding the semiconductor wafer in a horizontal position rotates to remove contaminants including particles and adhering to the semiconductor wafer from the semiconductor wafer.
REFERENCES:
patent: 4902531 (1990-02-01), Nakayama et al.
patent: 6478937 (2002-11-01), Olgado et al.
patent: 7048824 (2006-05-01), Werfel et al.
patent: 2002/0017910 (2002-02-01), Sakai
patent: 2003/0201184 (2003-10-01), Dordi et al.
patent: 2004/0139985 (2004-07-01), Hegedus et al.
patent: 2004/0194817 (2004-10-01), Pope et al.
patent: 2005/0121328 (2005-06-01), Shirakashi et al.
patent: 11-087306 (1999-03-01), None
patent: 2001-060575 (2001-03-01), None
patent: 2001-327936 (2001-11-01), None
patent: WO-00/65637 (2000-11-01), None
Kunemund Robert
Morrison & Foerster / LLP
Tokyo Electron Limited
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