Substrate processing apparatus and method

Cleaning and liquid contact with solids – Apparatus – Automatic controls

Reexamination Certificate

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Details

C134S0570DL, C134S061000, C134S062000, C134S066000, C134S113000, C134S902000, C118S668000, C414S222010, C414S222020, C414S222030, C414S222070

Reexamination Certificate

active

06945258

ABSTRACT:
A cleaning processing system including a wafer transfer device, a wafer detecting sensor for detecting a wafer, a memory for storing the position and direction of an extra wafer present inside the cleaning processing system when the power supply is cut off, an alarm device for generating an alarm in the case where the information detected by the wafer detecting sensor when the power supply to the cleaning processing system is turned on differs from the wafer information taken out of the memory, an alarm canceling section for canceling the alarm, an apparatus control section for controlling the wafer transfer device to recover the extra wafer, and a recovery start-up section for emitting an instruction to start the wafer recovery to the apparatus control section.

REFERENCES:
patent: 5015177 (1991-05-01), Iwata
patent: 5498294 (1996-03-01), Matsushita et al.
patent: 5518542 (1996-05-01), Matsukawa et al.
patent: 5686143 (1997-11-01), Matsukawa et al.
patent: 5700127 (1997-12-01), Harada et al.
patent: 9-17838 (1997-01-01), None
H.Hansen et al. Transport mechanism for auto control of sequential dipping operation. IBM Technical Disclosure Bulletin. vol. 23, No. 7A, Dec. 1980.

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