Abrading – Precision device or process - or with condition responsive... – By optical sensor
Reexamination Certificate
2005-09-13
2005-09-13
Morgan, Eileen P. (Department: 3723)
Abrading
Precision device or process - or with condition responsive...
By optical sensor
C451S010000, C451S011000, C451S285000, C156S345130
Reexamination Certificate
active
06942543
ABSTRACT:
The substrate polishing apparatus for polishing a polishing surface of a substrate comprises a film thickness monitoring device for monitoring a state of a film thickness of a thin film on the polishing surface of the substrate during polishing. The apparatus includes a table, a polishing member fixed on a surface of the table, a substrate support member for pressing the substrate onto the polishing member, an optical system composed of an optical fiber for irradiating the polishing surface of the substrate with a light of irradiation and an optical fiber for receiving a reflected light reflected on the polishing surface of the substrate, an analysis-processing system for processing an analysis of the reflected light received with the optical system, and the film-thickness monitoring device. The table is provided with a liquid-feeding opening for feeding a translucent liquid into a through-hole disposed in the polishing member.
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Kobayashi Yo-ichi
Nakai Shunsuke
Tsuji Hitoshi
Tsukuda Yasuo
Yamauchi Hiroki
Ebara Corporation
Morgan Eileen P.
Shimadzu Corporation
Wenderoth , Lind & Ponack, L.L.P.
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