Substrate polishing apparatus

Abrading – Precision device or process - or with condition responsive... – By optical sensor

Reexamination Certificate

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Details

C451S010000, C451S011000, C451S285000, C156S345130

Reexamination Certificate

active

06942543

ABSTRACT:
The substrate polishing apparatus for polishing a polishing surface of a substrate comprises a film thickness monitoring device for monitoring a state of a film thickness of a thin film on the polishing surface of the substrate during polishing. The apparatus includes a table, a polishing member fixed on a surface of the table, a substrate support member for pressing the substrate onto the polishing member, an optical system composed of an optical fiber for irradiating the polishing surface of the substrate with a light of irradiation and an optical fiber for receiving a reflected light reflected on the polishing surface of the substrate, an analysis-processing system for processing an analysis of the reflected light received with the optical system, and the film-thickness monitoring device. The table is provided with a liquid-feeding opening for feeding a translucent liquid into a through-hole disposed in the polishing member.

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patent: 2000-254860 (2000-09-01), None
patent: 2001-88021 (2001-04-01), None
patent: 2001-235311 (2001-08-01), None
patent: 01/20304 (2001-03-01), None

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