Substrate manufacturing method

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S480000

Reexamination Certificate

active

07008860

ABSTRACT:
This invention provides a method of manufacturing a substrate having a thin buried insulating film. An insulating layer (12) is formed on a single-crystal Si substrate (11). Ions are implanted into the substrate (11) through the insulating layer (12) to form an ion-implanted layer (13). The insulating layer (12) is thinned down to form a thin insulating layer (12a). A thus prepared first substrate is placed on a second substrate (20) to form a bonded substrate stack (30). After that, the bonded substrate stack (30) is split at the ion-implanted layer (13).

REFERENCES:
patent: 5374564 (1994-12-01), Bruel
patent: 5909626 (1999-06-01), Kobayashi
patent: 5994207 (1999-11-01), Henley et al.
patent: 6251754 (2001-06-01), Ohshima et al.
patent: 6368947 (2002-04-01), Yu
patent: 6503811 (2003-01-01), Ohkubo
patent: 6556264 (2003-04-01), Hirakata et al.
patent: 6613676 (2003-09-01), Yonehara et al.
patent: 6661025 (2003-12-01), Hirabayashi
patent: 1 039 513 (2000-09-01), None
patent: 1 187 216 (2002-03-01), None
patent: 5-211128 (1993-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Substrate manufacturing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Substrate manufacturing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate manufacturing method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3605026

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.