Substrate identification circuit and semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

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C257S288000, C257S347000, C257S392000

Reexamination Certificate

active

06867430

ABSTRACT:
Provided is a substrate identification circuit that generates a numeric value, whose duplication is difficult and which is proper to a substrate, at low cost and a semiconductor device having such a substrate identification circuit. A substrate identification circuit304is produced by utilizing variations in characteristics among TFTs formed on a substrate having an insulating surface. The substrate identification circuit304includes a plurality of proper bit generating circuits, each of which is constructed from a plurality of TFTs and outputs a one-bit random number based on variations in characteristics among the plurality of TFTs. The substrate identification circuit generates a numeric value proper to the substrate using the one-bit random number. The substrate identification circuit may include a circuit that makes a judgment by comparing the numeric value proper to the substrate with an identification number inputted from the outside.

REFERENCES:
patent: 6424331 (2002-07-01), Ozawa
patent: 6437367 (2002-08-01), Yamazaki et al.
patent: 20030075745 (2003-04-01), Maeda et al.
patent: 20030075746 (2003-04-01), Maeda et al.
S. Maeda et al., “An Artificial Fingerprint Device (AFD) Module using Poly-Si Thin Film Transistors with Logic LSI Compatible Process for Built-in Security”, IEDM 01 759-762, 2001.

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