Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2005-08-03
2009-02-24
Toledo, Fernando L (Department: 2895)
Semiconductor device manufacturing: process
With measuring or testing
C438S015000, C438S016000, C438S017000, C438S018000, C438S943000, C438S946000, C355S078000, C355S095000, C355S099000, C355S053000
Reexamination Certificate
active
07494828
ABSTRACT:
A second substrate, e.g. a III/V compound semiconductor, is placed on a first substrate, e.g. a wafer, in the vicinity of placement marks on the first substrate. The second substrate is exposed to patterned radiation, e.g. for the manufacture of integrated circuits.
REFERENCES:
patent: 6583858 (2003-06-01), van Schaik et al.
patent: 6822730 (2004-11-01), Krikhaar et al.
patent: 2005/0094120 (2005-05-01), Sekigawa et al.
patent: 2007/0111116 (2007-05-01), Noudo et al.
patent: 2007/0128556 (2007-06-01), Hasegawa et al.
U.S. Appl. No. 11/170,735, filed Jun. 30, 2005.
Best Keith Frank
Krikhaar Johannes Wilhelmus Maria
Pellens Rudy Jan Maria
ASML Netherlands B.V.
Lee Jae
Pillsbury Winthrop Shaw & Pittman LLP
Toledo Fernando L
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