Substrate grooves to reduce underfill fillet bridging

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S125000, C438S126000, C257S778000, C257SE23021

Reexamination Certificate

active

10927568

ABSTRACT:
An apparatus having and method of forming grooves in the surface of a substrate adjacent and parallel to sidewall locations for circuit chips or die mounted on the surface. The grooves have physical dimensions to retain fill material formed between the packages and the surface of the substrate so that the fill material does not bridge between chips, thus reducing warping of the substrate due to mismatches in coefficient of thermal expansion (CTE) between the fill material, the substrate, the chips, and mold material formed over the substrate, under fill, and chips.

REFERENCES:
patent: 5218234 (1993-06-01), Thompson et al.
patent: 5558267 (1996-09-01), Humphrey et al.
patent: 5629566 (1997-05-01), Doi et al.
patent: 5855821 (1999-01-01), Chau et al.
patent: 6291264 (2001-09-01), Tang et al.
patent: 6426565 (2002-07-01), Bhatt et al.
patent: 6448507 (2002-09-01), Fontecha et al.
patent: 6853089 (2005-02-01), Ujiie et al.
patent: 2002/0084518 (2002-07-01), Hasebe et al.
patent: 2005/0051885 (2005-03-01), Weng et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Substrate grooves to reduce underfill fillet bridging does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Substrate grooves to reduce underfill fillet bridging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate grooves to reduce underfill fillet bridging will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3854444

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.