Substrate for sample analyses

Chemical apparatus and process disinfecting – deodorizing – preser – Control element responsive to a sensed operating condition

Reexamination Certificate

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Details

C422S051000, C422S082090, C436S164000, C436S165000, C250S428000, C356S246000

Reexamination Certificate

active

07597852

ABSTRACT:
Apparatus and methods for screening a library of materials. Materials are provided in a plurality of locations on a substrate. The locations include first regions that are sufficiently transparent to a first form of radiation to permit analysis of the portion of the sample material supported in the first region using a first analytical technique, and second regions that are sufficiently transparent to a second form of radiation to permit analysis of a portion of the sample supported in the second region using a second analytical technique, but are insufficiently transparent to the first form of radiation to permit analysis of the portion of the sample material supported in the second region using the first analytical technique. Sample materials are screened at one or more sample locations of the substrate using the first analytical technique in the first region and the second analytical technique in the second region.

REFERENCES:
patent: 4675889 (1987-06-01), Wood
patent: 5022064 (1991-06-01), Iketaki
patent: 5776359 (1998-07-01), Schultz et al.
patent: 6157449 (2000-12-01), Hajduk
patent: 6371640 (2002-04-01), Hajduk et al.
patent: 6373570 (2002-04-01), McFarland et al.
patent: 6536944 (2003-03-01), Archibald et al.
patent: 6664067 (2003-12-01), Hajduk et al.
patent: 6679130 (2004-01-01), Hajduk et al.
patent: 6680996 (2004-01-01), Yokhin
patent: 6936471 (2005-08-01), Hajduk et al.
patent: 7018838 (2006-03-01), Murphy et al.
patent: 2003/0124028 (2003-07-01), Carlson
patent: 2003/0153089 (2003-08-01), Kuil
patent: 2 344 755 (2004-11-01), None
patent: WO 02/06802 (2002-01-01), None
patent: WO 03/031959 (2003-04-01), None
patent: WO 03/060497 (2003-07-01), None

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