Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Heterojunction formed between semiconductor materials which...
Reexamination Certificate
2007-02-02
2010-06-29
Rao, G. Nagesh (Department: 1792)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Heterojunction formed between semiconductor materials which...
C257S201000, C438S795000, C117S083000, C117S084000, C117S085000, C117S086000, C117S087000, C117S101000
Reexamination Certificate
active
07745854
ABSTRACT:
It is to provide a substrate for growing a semiconductor, which is effective for suppressing an occurrence of surface defects different in type from hillock defects in case of epitaxially growing a compound semiconductor layer, particularly an Al-based compound semiconductor layer.In a substrate for growing a compound semiconductor, in which a crystal surface inclined at a predetermined off angle with respect to a (100) plane is a principal plane, an angle made by a direction of a vector obtained by projecting a normal vector of the principal plane on the (100) plane and one direction of a [0-11] direction, a [01-1] direction, a [011] direction and a [0-1-1] direction is set to be less than 35°, and the compound semiconductor layer is epitaxially grown on the substrate.
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Hirano Ryuichi
Kurita Hideki
Birch & Stewart Kolasch & Birch, LLP
Nippon Mining & Metals Co., Ltd.
Rao G. Nagesh
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