Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-12-25
2007-12-25
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C345S087000, C345S098000
Reexamination Certificate
active
11295432
ABSTRACT:
A substrate for an electro-optical device includes amplifiers each has a first node and a second node, the first node connected to a signal line and being input with a first potential signal, the second node being input with a second potential signal, each amplifier outputting signals such that the potential of the first node is further decreased when the first potential signal is low, and the potential of the first node is further increased when the first potential signal is high. At least two signal lines correspond to at least one of the first and second nodes. A selection unit that selects one signal line. A connection unit connect the selected signal line to at least one of the first and second nodes.
REFERENCES:
patent: 5377030 (1994-12-01), Suzuki et al.
patent: 6864703 (2005-03-01), Miyagawa et al.
patent: 7167151 (2007-01-01), Yamashita
patent: A 05-341302 (1993-12-01), None
patent: A 07-333278 (1995-12-01), None
patent: A 10-104563 (1998-04-01), None
patent: A 2004-226551 (2004-08-01), None
patent: A 2005-024558 (2005-01-01), None
patent: A 2003-0008407 (2003-01-01), None
patent: A 2003-0064467 (2003-08-01), None
patent: WO 03/065339 (2003-08-01), None
patent: WO 03/65339 (2003-08-01), None
Karlsen Ernest
Oliff & Berridg,e PLC
Seiko Epson Corporation
LandOfFree
Substrate for electro-optical device, testing method... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Substrate for electro-optical device, testing method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate for electro-optical device, testing method... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3891243