Substrate for an information recording medium, information...

Abrading – Abrading process – Utilizing fluent abradant

Reexamination Certificate

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C451S041000, C451S059000, C065S061000

Reexamination Certificate

active

06852010

ABSTRACT:
A substrate for an information recording medium has a microwaviness average height Ra′ not greater than 0.05 microinch as measured by a contactless laser interference technique for measurement points within a measurement region of 50 μm□-4 mm□ on a surface of the substrate. The microwaviness average height Ra′ is given by:Ra′=1n⁢∑i=1n⁢ |xi-x_|,where xi represents a measurement point value of each measurement point, {overscore (x)} representing an average value of the measurement point values, n representing the number of said measurement points. Alternatively, the substrate has a waviness period between 300 μm and 5 mm and a waviness average height Wa of 1.0 nm or less as measured by the contactless laser interference technique for measurement points in a measurement region surrounded by two concentric circles which is spaced from a center of a surface of the substrate by a predetermined distance. The waviness average height Wa is given by:Wa=1N⁢∑i=1N⁢ |Xi-X_|where Xi represents a measurement point value of each measurement point, {overscore (X)} representing an average value of the measurement point values, n representing the number of said measurement points.

REFERENCES:
patent: 5389422 (1995-02-01), Okazaki et al.
patent: 5455730 (1995-10-01), Dovek et al.
patent: 5609517 (1997-03-01), Lofaro
patent: 5876269 (1999-03-01), Torii
patent: 5899794 (1999-05-01), Shige et al.
patent: 6068906 (2000-05-01), Sasa et al.
patent: 6132292 (2000-10-01), Kubo
patent: 6159076 (2000-12-01), Sun et al.
patent: 6207247 (2001-03-01), Morita
patent: 6336945 (2002-01-01), Yamamoto et al.

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