Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Reexamination Certificate
2011-08-30
2011-08-30
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Alignment marks
C257S061000, C257SE23179, C428S195100, C438S401000
Reexamination Certificate
active
08008789
ABSTRACT:
A substrate for a display panel includes an alignment accuracy measurement mark which is used for measuring alignment accuracy between patterns on the substrate without decreasing an aperture ratio of a pixel. The substrate for a display panel includes the alignment accuracy measurement mark in an isolated configuration which is used for measuring alignment accuracy between a pattern of a gate signal line and an auxiliary capacitance line and a pattern of a source signal line and a drain line, where the alignment accuracy measurement mark has a shape such that at least one straight line portion is included, is formed in a layer where the pattern of the source signal line and the drain line is formed, and is positioned on the gate signal line.
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Noda et al.; “Substrate for a Display Panel, and a Display Panel Having the Same”; U.S. Appl. No. 12/067,518, filed Apr. 4, 2008.
Enda Kenji
Noda Tomoki
Takeuchi Masanori
Joy Jeremy
Keating & Bennett LLP
Sharp Kabushiki Kaisha
Smith Zandra
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