Substrate cleaning method and cleaning apparatus

Cleaning and liquid contact with solids – Processes – With work or work parts movable during treatment

Reexamination Certificate

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Details

C134S001000, C134S001300, C134S032000, C134S034000, C134S184000, C134S187000, C134S198000, C438S906000

Reexamination Certificate

active

07077916

ABSTRACT:
A substrate is cleaned by supplying an ultrasonically-agitated cleaning liquid onto the substrate from a nozzle provided above the substrate while spinning the substrate. The substrate being cleaned is spun at a rotational speed of 2600 rpm or more and 3500 rpm or less, or at a rotational speed of 260×V/D (rpm) or more and 350×V/D (rpm) or less, where D (mm) is a diameter of the nozzle and V (mm/sec) is a moving velocity of the nozzle.

REFERENCES:
patent: 5562778 (1996-10-01), Koretsky et al.
patent: 5785068 (1998-07-01), Sasaki et al.
patent: 5980647 (1999-11-01), Buker et al.
patent: 6003527 (1999-12-01), Netsu et al.
patent: 6367490 (2002-04-01), Namba
patent: 6494985 (2002-12-01), Sotozaki et al.
patent: 6583071 (2003-06-01), Weidman et al.
patent: 6638366 (2003-10-01), Lammert et al.
patent: 6643882 (2003-11-01), Sotozaki et al.
patent: 6730176 (2004-05-01), Kuyel
patent: 6748961 (2004-06-01), Treur
patent: 2001/0024767 (2001-09-01), Toshima et al.
patent: 2002/0035762 (2002-03-01), Okuda et al.
patent: 8-318235 (1996-12-01), None
patent: 2001-7067 (2001-01-01), None

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