Substrate characterization device and method for...

Details Substrate characterization device and method for... Substrate characterization device and method for...

2008-11-06

2010-12-21

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S671000, C324S071100, C324S452000

Reexamination Certificate

active

07855565

ABSTRACT:
A substrate characterization device is provided which includes a sensor module and a processor. The sensor module has at least one contact surface configured to contact the substrate, the sensor module configured to measure a variance of capacitance in at least two dimensions of the substrate, the sensor module further configured to generate a signal indicative of the measured variance. The processor is in operative communication with a memory module and configured to execute a series of programmable instructions for making a comparison of the signal generated by the sensor module with at least one reference signal. The processor is further configured to generate at least one characterization signal based on the comparison.

REFERENCES:
patent: 4610530 (1986-09-01), Lehmbeck et al.
patent: 5747698 (1998-05-01), Spillman, Jr. et al.
patent: 5934140 (1999-08-01), Jackson et al.
patent: 6087837 (2000-07-01), Chase
patent: 6384611 (2002-05-01), Wallace et al.
patent: 6844937 (2005-01-01), Dempsey et al.
patent: 7271593 (2007-09-01), Junginger et al.
patent: 7433539 (2008-10-01), Wang et al.
patent: 2005/0089200 (2005-04-01), Nysaether
patent: 2006/0228486 (2006-10-01), Facci et al.

Affiliated with

Also associated with

Rating

Substrate characterization device and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Substrate characterization device and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate characterization device and method for... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4163576